The following STN Workshops will be held August 26, 2008 at CTC in Vancouver, British Columbia. STN Workshops are free, but registration is required.
9:00 am - 12:00 pm: Basic Patent Search Techniques
Learn about:
- The patent process
- Types of patent searches
- STN patent coverage
- Techniques for searching patent number, inventors, and assignees
To register, complete the STN Workshop and User Meeting Registration Form.
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1:00 pm - 4:00 pm: Patent Family and Legal Status Search Techniques
Learn about:
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STN patent family coverage
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Techniques for searching patent family equivalents
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STN patent legal status coverage
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Techniques for searching and monitoring patent legal status
To register, complete the STN Workshop and User Meeting Registration Form.
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The following STN User Update will be held
August 27, 2008 at the
Vancouver Marriott Pinnacle Downtown Hotel in Vancouver, British Columbia. STN User Updates are free, but
registration is required.
9:00 am - 4:00 pm
What's New on STN?
To improve your searching efficiency, get up-to-date on the latest from STN. In this session, we will discuss:
- Updates to the latest version of STN Express and other STN interfaces
- Enhancements to CAS and STN databases
- STN resources for new and experienced searchers
- Tips to make STN searching more efficient
Improving Searches by Including Patent Classification Codes
Technology classification codes, i.e., class and subclass designations, are assigned to each granted patent and each published application. A patent classification code represents a searchable collection of patents grouped together according to similarly claimed subject matter. In this session, we will discuss:
Increasing Your Confidence in STN Patent Search Results
Improve confidence in your patent search results by reviewing STN commands and tools. Tips will include:
- Using appropriate truncation and proximity in bibliographic and full-text patent databases
- Utilizing online thesauri to increase relevant retrieval
- Extending searches effectively across other databases
- Identifying terminology changes across databases
- Extracting terms for duplicate identification and analysis
Enhanced Data Analysis with STN Express, STN AnaVist, and STN Viewer
STN Express, STN AnaVist, and STN Viewer can help you assimilate and present sci-tech information more effectively throughout your organization. In this session, learn how to use STN Express, Version 8.3, to obtain precision data sets for analysis with:
- STN AnaVist, Version 2.0 - analysis and visualization software that provides a view of current research areas, insights into competitor strategies, and opportunities for maximizing corporate intellectual property
- STN Viewer - a workflow productivity tool for patent information users designed to simplify the management and evaluation of full-text patent documents
To register, complete the STN Workshop and User Meeting Registration Form.
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Updated 7/14/2008 3:34:32 PM
